Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains

ITC（2008）

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摘要

A deterministic diagnosis method for multiple timing faults in scan chains is proposed. Compared to prior work, our approach can diagnose mask-effect multiple timing faults as well as conventional mixed multiple timing faults. Experimental results on ISCAS'89 benchmark circuits demonstrate that the average diagnosis resolution of two faults is less than 3.

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关键词

benchmark circuits,mask effect,fault diagnosis,multiple timing faults,benchmark testing,scan chains,circuit testing

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