Investigation of the Electron-Backscattering Process from Ru(0 0 0 1) and Ag(0 0 1) Surfaces

The 37eV Auger electron yield and the secondary electron emission intensity from a Ru(0001)-face in a take-off direction of 42.30°, both related to the generation factor which includes the contribution of the primary current and the backscattering fraction, have been measured as a function of the primary electron energy, Ep. A standard sample of a Ag(001) surface has been used to measure the elastically backscattered electron (EBE) intensity to be able to compare the results obtained by means of the CMA analyser with the theoretical and the experimental ones presented by Jablonski et al. given in RFA analyser geometry. Furthermore, the EBE intensity has been measured from the Ru(0001) surface.