Piezoelectricity of Ferroelectret Porous Polyethylene Thin Film

JAPANESE JOURNAL OF APPLIED PHYSICS(2009)

引用 19|浏览2
暂无评分
摘要
A ferroelectret porous polyethylene (Fp-PE) film with a thickness of 30 mu m and a porosity of 58% was fabricated; its perpendicular piezoelectric constant d(33) was 80 pC/N. In the Fp-PE film observed by atomic force microscopy (AFM), pores with a diameter of about 0.3 mu m were almost homogeneously distributed. Moreover, from piezoresponse force microscopy (PFM), it was found that areas surrounding the pores shift in one direction following the application of ac voltage, but that areas far from the pores cannot move freely. These results indicate that the electrical charges trapped in areas surrounding the pores in the Fp-PE film play an important role in piezoelectricity. (C) 2009 The Japan Society of Applied Physics
更多
查看译文
关键词
piezoresponse force microscopy,atomic force microscopy,thin film
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要