A Reliable Near-Threshold Voltage SRAM-Based PUF Utilizing Weight Detection Technique

Lih-Yih Chiou,Jing-Yu Huang, Chi-Kuan Li, Chen-Chung Tsai

2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)(2021)

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摘要
With the continuous advancement of technology, security issues have become increasingly important. In the applications of Internet of Things (IoT), millions of IoT devices are designed to collect data that are sensitive or private. It is crucial to secure such devices. Therefore, every vulnerable device needs to be protected during either communication or operation. Physical unclonable function (P...
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关键词
Manufacturing processes,Layout,Very large scale integration,Fingerprint recognition,Physical unclonable function,Reliability engineering,Energy efficiency
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