Anomalous Drain Voltage Dependence in Bias Temperature Instability Measurements on High-Κ Field Effect Transistors.J. K. Mee,R. A. B. Devine,L. Trombetta,R. J. Kaplar,P. GoukerMicroelectronics Reliability（2011）引用 3|浏览7AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
