The DELPHI pixels

K.H. Becks,P. Borghi,J.M. Brunet,M. Caccia,J.C. Clemens,M. Cohen-Solal,B. Courty,W. de Boer,P. Delpierre, J. Drees,P. Gerlach,K.W. Glitza,I.M. Gregor,L. Guglielmi,F. Hartmann,J.M. Heuser,J.J. Jaeger,M. Kaiser,S. Kersten,D. Knoblauch,A. Koepert,H. Leb,F. Ledroit,G. Maehlum, C. Meroni,S. Meyer,K. Moenig,T. Mouthuy,H. Pert,M. Pindo, M. Raymond, N. Redaelli,L. Roos,D. Sauvage, P. Sicho,G. Tristram,J.P. Turlot,B. Uberschar,G. Vegni, V. Vrba,M. Wielers

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT（1997）

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摘要

To improve tracking in the very forward direction for running at LEP200, the angular acceptance of the DELPHI Vertex detector has been extended from 45 degrees to 11 degrees with respect to the beam axis. Pixel detector crowns cover the region between 25 degrees and 13 degrees. Due to very tight space and material thickness constraints it was necessary to develop new techniques (integrated busses in the detector substrate, high density layout on Kapton, etc.). About 1000 cm(2) of pixels are already installed and working in DELPHI. Techniques, tests and production of these detectors will be described, as well as the main problems encountered during this work.

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关键词

delphi technique

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