A Parallel TCXO Test System

Liang Chen,Feng Tian,Shunxiao Wu,Yangbo Huang,Gang Ou

IMCCC '12 Proceedings of the 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control（2012）

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摘要

The present TCXO (Temperature Compensated Crystal Oscillator) test systems have low test efficiency because of frequency meter limited in quantity. This paper proposes a parallel TCXO test system, which uses a parallel frequency meter. The proposed system can test 100 TCXOs simultaneously, and has the frequency measurement error of fully meeting the accuracy requirement of the design and production of state-of-art TCXOs.

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关键词

temperature compensated crystal oscillator,frequency meters,measurement errors,frequency measurement error,tcxo test system,parallel tcxo test system,present tcxo,frequency measurement,mass production,frequency meter,low test efficiency,proposed system,test system,state-of-art tcxos,parallel frequency meter

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