A Sige Bicmos Instrumentation Channel For Extreme Environment Applications

C. Ulaganathan,N. Nambiar, B. Prothro,R. Greenwell,S. Chen,B. J. Blalock,C. L. Britton,M. N. Ericson,J. D. Cressler, H. Hoang,R. Broughton,K. Cornett,G. Fu,H. A. Mantooth,R. W. Berger

2008 51ST MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2（2008）

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Abstract

A instrumentation channel has been designed, implemented and tested in a 0.5-mu m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces a range of external sensors to signal processing circuits. Also, analog sampling has been implemented in the channel using a flying capacitor configuration. Measurement results show the instrumentation channel supports input signals up to 200Hz.

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Key words

BiCMOS integrated circuits,Ge-Si alloys,bridge circuits,integrated circuit testing,signal processing,BiCMOS instrumentation channel,SiGe,extreme environment,flying capacitor,integrated circuit testing,reconfigurable Wheatstone bridge network,signal processing circuits,size 0.5 micron,

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