Inference on the MTTF of LEDs from Accelerated Degradation Data with Bootstrap Method
Innovative Computing, Information and Control（2009）
摘要
In reliability analysis, engineers lacks confidence to verify the mean time to failure of high power light emitting diodes from aging or degradation tests. The lifetime information, however, is important to manufacturers to improve the quality of light emitting diodes. The paper provides a bootstrap computation procedure to infer the mean time to failure of high power light emitting diodes. Assume that the degradation paths collected from an accelerated degradation test follow a Wiener process, confidence interval of the mean time to failure of high power light emitting diodes is found based on bootstrap percentiles. An illustrating example of GaN-based LEDs is used to demonstrate the use of the proposed method.
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关键词
accelerated degradation test,degradation test,degradation path,stochastic processes,confidence interval,statistical analysis,reliability analysis,accelerated degradation data,quality improvement,bootstrap percentiles,aging test,mean time to failure,failure analysis,gan,light emitting diode,reliability,mean time,lifetime information,light emitting diodes,led,gan-based leds,bootstrap computation procedure,wiener process,ageing,bootstrap method,high power light,temperature measurement,degradation,inverse gaussian
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