Fine-Grain Leakage Power Reduction Method for m-out-of-n Encoded Circuits Using Multi-threshold-Voltage Transistors.
Chapel Hill, NC（2009）
摘要
To the casual observer, glitches occurring in quasi delay-insensitive logic would appear to cause incorrect operation and render the circuits unusable. This paper presents an informal analysis of the effects of glitches occurring on the long interconnect ...
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关键词
m-out-of-n encoded circuits,casual observer,fine-grain leakage power reduction,incorrect operation,multi-threshold-voltage transistors,informal analysis,quasi delay-insensitive logic,asynchronous,transistors,power dissipation,crosstalk,sleep,voltage,logic gates,protocols,energy dissipation,combinational circuits,benchmark testing,threshold voltage,low power electronics
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