Electrical and structural characterisation of single ZnO nanorods

Th. Weimann,P. Hinze,E. Schlenker,A. Bakin,A. C. Mofor,A. Behrends, A. Waag

MICROELECTRONIC ENGINEERING（2008）

Cited 7|Views2

No score

Abstract

Zinc oxide (ZnO) nanorods grown by vapor transport were contacted individually with Ti/Au electrodes structured by e-beam lithography. The rectifying behaviour observed in the current-voltage characteristics is likely caused by an interfacial insulating layer between the ZnO nanowires and the contact material. Energy-dispersive X-ray spectroscopy (EDX) measurements performed on electrically measured and non measured reference nanowires reveal that no electromigration of Au or Ti into the nanowires occurs.

Translated text

Key words

e-beam lithography,current-voltage characteristic,nanorods,edx,reference nanowires,single zno nanorods,zno,zno nanowires,structural characterisation,energy-dispersive x-ray spectroscopy,tem,contact material,zinc oxide,vapor transport,au electrode,electromigration,nanowires,e beam lithography

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined