Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test
Southampton（2006）
摘要
Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ...
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关键词
production test,global control signal,delay test,higher fault coverage,improve snr measurement,slow speed,sampling clock jitter,d converters,oscillations,production,noise measurement,crystal oscillators,jitter,quantization noise,phase locked loops,signal to noise ratio,high resolution,sampling methods,testing,phase locked loop,phase lock loop,quantization
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