Neighborhood selection for IDDQ outlier screening at wafer sort

Daasch, W.R.,McNames, James,Madge, R.,Cota, K.

Design & Test of Computers, IEEE （2002）

Cited 26|Views0

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Abstract

To screen defective dies, IDDQ tests require a reliable estimate of each die's defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers

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Key words

automatic test equipment,integrated circuit testing,wafer-scale integration,NNR,die outliers,identification,nearest-neighbor residual method,statistical post-processing,test measurements,wafer sort,

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