Zicheng XuGlasgow College University of Electronic Science and Technology of China关注立即认领分享关注立即认领分享基本信息浏览量:0职业迁徙个人简介暂无内容研究兴趣论文共 2 篇作者统计合作学者相似作者按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选时间引用量主题期刊级别合作者合作机构New Insights Into Noise Characteristics of Hot Carrier Induced Defects in Polysilicon Emitter Bipolar Junction Transistors and SiGe HBTsKunfeng Zhu,Peijian Zhang,Zicheng Xu, Tao Wang,Xiaohui Yi,Min Hong,Yonghui Yang,Guangsheng Zhang,Jian Liu,Jianan Wei, Yang Pu, Dong Huang,IEEE Journal of the Electron Devices Society (2023): 30-35引用2浏览0EIWOS引用20Time-Dependent Hot Carrier Degradation in Polysilicon Emitter Bipolar Transistors Under High Current and Radiation Combined StressPeijian Zhang,Zicheng Xu, Tao Wang,Wensuo Chen,Min Hong,Kunfeng Zhu,Jiao Liu,Xian Chen,Jian Liu,Guangsheng Zhang, Sheng Qiu, Yan Wang,IEEE Transactions on Electron Devices(2021)引用3浏览0EIWOS引用30作者统计合作学者合作机构D-Core合作者学生导师暂无相似学者,你可以通过学者研究领域进行搜索筛选数据免责声明页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn