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Bio
Zhen Liu (Member, IEEE) received the B.S. and M.S. degrees in electrical engineering and the Ph.D. degree in detection technology and automatic equipment from Northwestern Polytechnical University (NPU), Xi’an, China, in 1999, 2002, and 2007, respectively.
Since 2007, he has been with the University of Electronic Science and Technology of China (UESTC), Chengdu, China, where he is currently a Professor with the Department of Instrument Science and Technology, School of Automation Engineering. From December 2013 to January 2015, he was a Visiting Scholar with the Department of Statistics and Applied Probability, University of California at Santa Barbara, Santa Barbara, CA, USA. He is the Research Director of Prognostics and Health Management (PHM) Laboratory, Electronic Testing Technology and Instruments Engineering Research Center, Ministry of Education of China, Chengdu. His current research interests include testability analysis, fault diagnosis, fault prediction, and lifetime estimate technology for electronic systems.
Research Interests
Papers共 7 篇Author StatisticsCo-AuthorSimilar Experts
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IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERSno. 4 (2024): 1615-1627
Mechanics of Advanced Materials and Structurespp.1-17, (2024)
IEEE Transactions on Instrumentation and Measurement (2023): 1-9
2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)pp.606-610, (2020)
2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)pp.390-395, (2020)
IEEE Conference Proceedings (2020): 606-610
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