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职业迁徙
个人简介
He has worked on a number of projects related to semiconductor manufacturing and packaging, including testing and characterization, and high precision metrology. He has been involved in the invention and development of several forms of Atomic Force Microscopies (AFM), for metrology and surface characterization on a nanometer scale. He has explored novel near-field inspection techniques involving electric fields over a wide range of frequencies, from DC to optical wavelengths (via focused laser beams) and to X-rays. He has also contributed to the fields of high density data storage (thermal-assisted magnetic storage) and nano-imprint lithography (pattern formation and registration), high-power processor cooling solutions involving novel metallic thermal interfaces, and high-concentration Photo-Voltaic systems for solar energy generation.
Recent activities address opto-electronic challenges, such as bonding micro-lasers onto Silicon Nano-photonic chips.
研究兴趣
论文共 47 篇作者统计合作学者相似作者
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arxiv(2020)
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CHEMICAL, BIOLOGICAL, RADIOLOGICAL, NUCLEAR, AND EXPLOSIVES (CBRNE) SENSING XX (2019)
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D-Core
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