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个人简介
Chadwin D. Young received his B.S. degree in Electrical Engineering from the Univ. of Texas at Austin in 1996 and his M.S. and Ph.D. in EE from the North Carolina State University in 1998 and 2004, respectively. In 2001, he joined SEMATECH where he completed his dissertation research on high-k gate stacks and continued this research at SEMATECH working up to Senior Member of the Technical Staff on electrical characterization and reliability methodologies for the evaluation of high-k gate stacks on current and future device architectures. He joined the Materials Science and Engineering and Electrical Engineering Departments in September 2012 where his research focus is on electrical characterization and reliability methodologies for the evaluation of future materials and devices. He is NSF CAREER Award recipient, and has authored or co-authored 325+ journal, conference and invited papers. He has served: on the management or technical program committees of IIRW, IRPS, SISC, IEDM, WoDiM, SNW; as Guest Editor for IEEE Transactions on Device and Materials Reliability; and as a peer reviewer for several journals. He is currently a Senior Member of IEEE and serves as a Device Reliability Physics Committee Member of the IEEE Electron Device Society.
研究兴趣
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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)pp.1-5, (2024)
2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM (2023)
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)pp.1-3, (2023)
2023 35th International Conference on Microelectronic Test Structure (ICMTS)pp.1-4, (2023)
Journal of Vacuum Science & Technology Ano. 2 (2023)
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)pp.1-4, (2022)
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