Yong Hyeon Yi

Yong Hyeon Yi (Graduate Student Member, IEEE) received the B.E degree in electronic engineering from Sogang University, Seoul, Korea, in 2019. He is currently pursuing the Ph.D. degree with the Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA. He was an intern with Intel Circuit Research Lab in Summer 2021 and Samsung SARC/ACL in Summer 2022. His research interests are resilient circuit design and on-chip circuit reliability characterization methodologies, such as electromigration in power delivery network and circuit interconnect.