基本信息
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Career Trajectory
Bio
Xiaowei (Vivi) Zhu received the B.S. and M.S. degrees in applied physics from the South China University of Technology, Guangzhou, China, in 1994 and 1997, respectively, and the M.S. and Ph.D. degrees in electrical engineering from Vanderbilt University, Nashville, TN, in 2000 and 2002, respectively.
She has been with Texas Instruments, Inc., Dallas, since 2002, as a Quality and Reliability Engineer. Her initial research interests are the characterization and modeling of radiation-induced soft-error rates in advanced CMOS technologies; currently, she is working in the area of medical electronics. She has authored more than ten papers in the field of radiation-induced single-event upset and one JEDEC soft-error rate testing specification (JESD-89) chapter and has two patents pending. She is a frequent Reviewer for Microelectronics Reliability.
Dr. Zhu served as the Technical Session Chair for the 2005 IEEE Nuclear Science Radiation Effect Conference, the 19th International Conference on the Application of Accelerators in Research and Industry, and the System Effect of Logic Soft Error Workshop II. She is a frequent Reviewer for the IEEE Transactions on Nuclear Science and the European Conference on Radiation and Its Effects on Components and Systems.
Research Interests
Papers共 11 篇Author StatisticsCo-AuthorSimilar Experts
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2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) (2011)
2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUALpp.478-+, (2008)
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Author Statistics
#Papers: 8
#Citation: 100
H-Index: 6
G-Index: 8
Sociability: 4
Diversity: 1
Activity: 0
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