Xavier Jehl

Xavier Jehl (xavier.Jehl@cea.fr) received his Ph.D. degree in physics from the Université Fourier, Grenoble, France, in 1999. While working on his doctoral degree, he was with the Atomic Energy Council (CEA), Grenoble, where he was involved in the experimental detection of doubled shot noise in mesoscopic superconductor/normal metal contacts. Since 2002, he has been working in the fundamental science division of CEA-Grenoble in close collaboration with the advanced complementary metal–oxide–semiconductor (CMOS) facility of CEA-LETI. His current topics of interest are silicon-based electron pumps, single-dopant nanoelectronics, and radio-frequency reflectometry.