基本信息
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Bio
William T. Shi (M'01) received a B.Sc. degree in physics in 1983 and an M.Sc. degree in applied physics in 1986, both from Nanjing University; he received M.Sc. and Ph.D. degrees in engineering from Yale University in 1992 and 1995, respectively. He was an assistant lecturer and then lecturer of acoustics at Nanjing University from 1986 to 1989. After postdoctoral training at Emory University, Dr. Shi became an assistant and then associate professor of radiology at Thomas Jefferson University during 1996 to 2002. Afterward, he was recruited to GE Ultrasound as a senior systems engineer. Since 2004, Dr. Shi has been a corporate researcher at Philips Research. His research interests include: sonothrombolysis, ultrasound contrast imaging, transcranial ultrasound imaging, cavitation with contrast microbubbles, ultrasound-mediated drug delivery, contrast-assisted blood pressure and flow velocity estimation, nonlinear ultrasound properties of biological tissues, and dynamics and instabilities of liquid interfaces.
Research Interests
Papers共 131 篇Author StatisticsCo-AuthorSimilar Experts
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Daniel S Kermany,Michael Goldbaum,Wenjia Cai,Carolina C S Valentim,Huiying Liang,Sally L Baxter,Alex McKeown,Ge Yang,Xiaokang Wu,Fangbing Yan, Justin Dong, Made K Prasadha,
David L Wenzler,Joel E Abbott,Jeannie J Su,William Shi,Richard Slater,Daniel Miller, Michelle J Siemens,Roger L Sur
Investigative radiologyno. 8 (2017): 477-481
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Author Statistics
#Papers: 100
#Citation: 9736
H-Index: 30
G-Index: 98
Sociability: 6
Diversity: 1
Activity: 0
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