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Papers共 92 篇Author StatisticsCo-AuthorSimilar Experts
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Ho Leung Chan,Shelby S Fields,Yueyun Chen, Tristan P O'Neill, Megan K Lenox,William A Hubbard,Jon F Ihlefeld, Brian C Regan
ACS nano (2024)
ULTRAMICROSCOPY (2024): 113939-113939
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 1608-1609
Microscopy and Microanalysisno. Supplement_1 (2023): 1851-1852
Oscar Recalde-Benitez,Tianshu Jiang,Robert Winkler,Yating Ruan,Alexander Zintler,Esmaeil Adabifiroozjaei,Alexey Arzumanov,William A. Hubbard,Tijn van Omme,Yevheniy Pivak,Hector H. Perez-Garza, B. C. Regan,
Communications Engineeringno. 1 (2023): 1-8
Microscopy and Microanalysisno. S1 (2022): 2508-2509
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.1-4, (2022)
Ho Leung Chan,Shelby S. Fields, Tristan O'Neill,Yueyun Chen,William A. Hubbard,Jon F. Ihlefeld, B. C. Regan
Microscopy and Microanalysisno. S1 (2022): 2270-2271
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