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Research Interests

Papers共 276 篇Author StatisticsCo-AuthorSimilar Experts

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In-Device Battery Failure Analysis
Guannan Qian,Guibin Zan,Jizhou Li,Dechao Meng, Tianxiao Sun, Vivek Thampy, Ayrton M Yanyachi,Xiaojing Huang,Hanfei Yan,Yong S Chu,Sheraz Gul, Juanjuan Huang, Shelly D Kelly,Sang-Jun Lee, Jun-Sik Lee,Wenbing Yun,Peter Cloetens,Piero Pianetta,Kejie Zhao,Ofodike A Ezekoye,Yijin Liu
Advanced materials (Deerfield Beach, Fla)no. 10 (2025): e2416915-e2416915
Cited0Views0WOSBibtex
0
0
Revisiting 3D X-ray for Board Level FA to In-line Metrology of Wafer Level Integration
S. H. Lau,Jeff Gelb,Sheraz Gul, Tianzu Qi, Vikram Singh,Sylvia Lewis,Wenbing Yun
2024 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, IPFA 2024 (2024)
Cited0Views0EIWOSBibtex
0
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Revisiting 3D-X-ray for Rapid Reverse Engineering in Large Electronic Packages and PCBs
Jr,Wenbing Yun,Jeff Gelb,Sheraz Gul,David Vine,Sylvia Lewis,Daniel Johnson,S. H. Lau
2022 IEEE PHYSICAL ASSURANCE AND INSPECTION OF ELECTRONICS (PAINE)pp.146-151, (2022)
Cited2Views0EIWOSBibtex
2
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Author Statistics

#Papers: 276

#Citation: 5836

H-Index: 38

G-Index: 65

Sociability: 6

Diversity: 2

Activity: 15

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