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I am currently working at Micron Technology, USA as a Semiconductor Process Engineer in Technology Development enabling FIB-SEM inline metrology for next-generation memory technologies.
I did my PhD at IITB-Monash Research Academy, under collaboration of Indian Institute of Technology Bombay (IITB), Mumbai, India, and Monash University, Melbourne, Australia. I was a recipient of Tata Consultancy Services (TCS) Research Scholarship and worked on the research topic ‘Focused Ion Beam (FIB) Fabrication of Novel 2D/3D Nanoscale Structures: Process Modelling and Applications’ with Prof. Rakesh G. Mote (IIT Bombay) and Prof. Jing Fu (Monash University). I did my masters with specialization in Manufacturing Engineering with Prof. Suhas Joshi at IIT Bombay, India and undergraduation in Mechanical Engineering at College of Engineering Roorkee, India.
During my PhD, I worked on focused ion beam (FIB) process for nanofabrication and its application in creating novel nanostructures. The material removal (milling or etching) with FIB was developed to create novel nanostructures, subsequent in-situ controlled manipulation towards desired functionality and applications such as anti-reflection and light trapping, structural color filtering, live cell imaging, bacterial mesh trapping etc. I also worked on ion induced, in-situ controlled manipulation of nanostructures and investigation through molecular dynamics (MD) simulations, to arrive at a feasible methodology. In-situ scanning electron microscopy (SEM) was employed for characterization of ion induced bending. This work is critical for 3D nanofabrication with promising nanoscale-controlled manipulation, strain engineering of nanostructures, opening new avenues in the diverse field of ion beams and applications beyond material science for realization of future nanoscale devices.
In my master's thesis work, I worked on ‘Numerical Modelling of Excimer Laser
Curved Surface Ablation’ towards development of a finite element model for laser ablation of polymers and realization of curved surfaces.
I have a good experience with FIB, SEM, lithographic approaches for nanofabrication,
SEM/TEM sample preparation, microscopic characterization techniques: Raman
spectroscopy, atomic force microscopy (AFM), UV visible spectroscopy etc. along with
theoretical and modelling exposure to electromagnetic finite-difference time-domain (FDTD) calculations- Lumerical, molecular dynamics (MD) calculations- LAMMPS, finite element analysis (FEA), COMSOL, MATLAB etc.
研究兴趣
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OPTICS EXPRESSno. 17 (2021): 26645-26657
Journal of physical chemistry C/Journal of physical chemistry Cno. 35 (2020): 19389-19395
Ultramicroscopy (2020): 113036-113036
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