Vincent Delaye - CEA-LETI, MINATEC | 人才画像

基本信息

Career Trajectory

Bio

Vincent Delaye received the M.Sc. degree from Telecom Saint-Etienne, Saint-Étienne, France, and the Ph.D. degree from Grenoble INP, Grenoble, France, in 2000. Since 2011, he has been managing the LETI competence center in electron microscopy within the platform for nanocharacterization at MINATEC Campus.

Research Interests

Papers共 29 篇Author StatisticsCo-AuthorSimilar Experts

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Electron Beam Propagation Impact on High-Resolution Quantitative Chemical Analysis of GaN/AlGaN 1 Nm-Thick Quantum Wells

Florian Castioni,Patrick Quéméré,Sergi Cuesta,Vincent Delaye,Pascale Bayle-Guillemaud,Eva Monroy,Eric Robin,Nicolas Bernier

BIO Web of Conferences (2024): 06013

Cited0Views0Bibtex

Impact of Strain on Si and Sn Incorporation in (si)gesn Alloys by STEM Analyses

Florian Castioni, Loic Henry,Lara Casiez,Nicolas Bernier,Vincent Reboud,Jeremie Chretien,Nicolas Pauc,Vincent Calvo,Jerome Richy,Audrey Jannaud,Vincent Delaye,Eric Robin,Jean-Michel Hartmann,Pascale Bayle-Guillemaud

Journal of applied physics（2022）

Cited2Views0Bibtex

Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 Nm-Thick Quantum Wells

Florian Castioni,Sergi Cuesta,Nicolas Bernier,Patrick Quéméré,Eric Robin,Vincent Delaye,Eva Monroy,Pascale Bayle-Guillemaud

Microscopy and Microanalysisno. S1 (2022): 2564-2566

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Characterization of AlGaN/GaN Degradations During Plasma Etching for Power Devices

Frederic Le Roux,Nicolas Posseme,Pauline Burtin,Patrice Gergaud,Vincent Delaye

Microelectronic Engineering（2021）

Cited8Views0EIBibtex

(G03 Best Paper Award Winner) Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

Andrea Quintero Colmenares,Patrice Gergaud,Jean-Michel Hartmann,Vincent Delaye,Nicolas Bernier,David Cooper,Zineb Saghi,Vincent Reboud,Eric Cassan,Philippe Rodriguez

ECS Meeting Abstractsno. 24 (2020): 1750-1750

Cited0Views0Bibtex

Impact and Behavior of Sn During the Ni/GeSn Solid-State Reaction

Andrea Quintero,Patrice Gergaud,Jean-Michel Hartmann,Vincent Delaye,Vincent Reboud,Eric Cassan,Philippe Rodriguez

Journal of Applied Crystallography（2020）

Cited13Views0WOSBibtex

Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

Andrea Quintero,Patrice Gergaud,Jean-Michel Hartmann,Vincent Delaye,Nicolas Bernier,David Cooper,Zineb Saghi,Vincent Reboud,Eric Cassan,Philippe Rodriguez

ECS Transactionsno. 5 (2020): 365-375

Cited10Views0Bibtex

GeSn Heterostructure Micro-Disk Laser Operating at 230 K

Quang Minh Thai,Nicolas Pauc,Joris Aubin,Mathieu Bertrand,Jeremie Chretien,Vincent Delaye,Alexei Chelnokov,Jean-Michel Hartmann,Vincent Reboud,Vincent Calvo

Optics Express（2018）

Cited78Views0WOSBibtex

2D & 3D Advanced Transmission Electron Microscopy for Semiconductor Characterization

Vincent Delaye,Nicolas Bernier,Zineb Saghi,Tony Printemps,Guillaume Audoit, Jean-Luc-Rouvière,David Cooper

semanticscholar（2018）

Cited0Views0Bibtex

Atom probe tomography for advanced semiconductor nanodevices

Adeline Grenier,Isabelle Mouton,Robert Estivill,Tony Printemps,Guillaume Audoit,F. Vurpillot,D. Blavette,Zineb Saghi,Vincent Delaye,Jean-Paul Barnes

semanticscholar（2017）

Cited0Views0Bibtex

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