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Papers共 84 篇Author StatisticsCo-AuthorSimilar Experts
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IEEE Transactions on Very Large Scale Integration (VLSI) Systemsno. 99 (2024): 1-8
Vina Faramarzi, Etienne de Poortere, Syam Parayil Venugopalan, Pieter Woltgens, Youngtag Woo,Mark van de Kerkhof, Pawan Kumar,Henry Medina Silva,Pierre Morin,Inge Asselberghs,Chelsey Dorow, Kevin O'Brien,
Novel Patterning Technologies 2024 (2024)
A. Penumatcha,K. P. O’Brien, K. Maxey, W. Mortelmans, R. Steinhardt, S. Dutta,C. J. Dorow, C. H. Naylor A., Kitamura Kitamura, T. Zhong, T. Tronic, P. Buragohain,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
A. Provias,T. Knobloch, A. Kitamura,K. P. O’Brien,C. J. Dorow,D. Waldhoer,B. Stampfer, A. V. Penumatcha,S. Lee, R. Ramamurthy, S. Clendenning,M. Waltl,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Kevin P. O’Brien,Carl H. Naylor,Chelsey Dorow,Kirby Maxey,Ashish Verma Penumatcha, Andrey Vyatskikh, Ting Zhong,Ande Kitamura,Sudarat Lee,Carly Rogan,Wouter Mortelmans, Mahmut Sami Kavrik,
Nature Communicationsno. 1 (2023): 1-5
C. H. Naylor,Kirby Maxey,C. Jezewski,K. P. O'Brien, A. V. Penumatcha,M. S. Kavrik,B. Agrawal, C. V. Littlefield, J. Lux,B. Barley,Justin R. Weber,A. Sen Gupta,
VLSI Technology and Circuitspp.1-2, (2023)
C. J. Dorow,T. Schram,Q. Smets,K. P. O’Brien, K. Maxey, C.-C. Lin,L. Panarella,B. Kaczer,N. Arefin, A. Roy, R. Jordan,A. Oni,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Sou-Chi Chang,Kisung Chae,Mihaela I. Popovici,Chia-Ching Lin, Saima Siddiqui,I-Cheng Tung,Jasper Bizindavyi, Bernal Granados Alpizar,Nazila Haratipour,Matthew Metz,Jack Kavalieros,Gouri S. Kar,
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