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Tomas Roch studied solid-state physics at the Comenius University in Bratislava, Slovakia. He received the M.Sc. degree in physics from the Brock University, St. Catharines, Canada in 1998 and the Ph.D. degree from Johannes Kepler University, Linz, Austria, in 2002. His Ph.D. dissertation was on the X-ray characterization of semiconductor nanostructures.
From 2002 to 2006, he was a Postdoctoral Fellow with the Institute for Solid State Electronics, Technical University of Vienna, Vienna, Austria. He was involved in the X-ray analysis and MBE growth of III–V semiconductor nanostructures. Since 2006, he has been with Faculty of Mathematics, Physics and Informatics, Comenius University, Bratislava, Slovakia, as a Research Assistant, where he is currently working in the field of low temperature STM and STS, X-ray scattering methods, processing and characterization of superconductor cryoelectronic devices.
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ACS Sensorsno. 11 (2019): 2997-3006
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