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个人简介
Takashi Sato (M’98) received B.E. and M.E. degrees in mineral
resource engineering and material science engineering from Waseda University, Tokyo, Japan and the Ph.D. degree in
informatics from Kyoto University, Kyoto, Japan, in 1989, 1991, and 2004, respectively.
He was with Hitachi Ltd., Tokyo, from 1991 to 2003, with Renesas Technology Corp., Tokyo, Japan, from 2003 to 2006,
and with the Tokyo Institute of Technology, Yokohama, Japan. In 2009, he joined the Graduate School of Informatics,
Kyoto University, where he is currently a Professor. He was a Visiting Industrial Fellow with the University of
California, Berkeley, from 1998 to 1999. His research interests include computer-aided design for nanometer-scale very
large scale integration design, fabrication-aware design methodology, and performance optimization for variation
tolerance.
Dr. Sato was a recipient of the Beatrice Winner Award at the 2000 IEEE International Solid-State Circuits Conference
and the Best Paper Award at the 2003 International Symposium on Quality Electronic Design. He is a member of the
Institute of Electronics, Information and Communication Engineers.
研究兴趣
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JAPANESE JOURNAL OF APPLIED PHYSICSno. 2 (2024)
IEEJ Transactions on Electrical and Electronic Engineeringno. 5 (2024): 908-914
2023 35th International Conference on Microelectronic Test Structure (ICMTS)pp.1-6, (2023)
IEEE Sensors Lettersno. 5 (2023): 1-4
IEEE Sensors Journalno. 20 (2023): 24050-24059
IEEE Robotics and Automation Lettersno. 10 (2023): 6435-6442
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