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Research Interests

Papers共 3 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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Early Inline Detection of Systematic Defects Using ATPG and Commonality Analysis on Product-Like Logic Yield Learning Vehicle
Felix Beaudoin, Zhigang Song,Stephen Lucarini, Thomas F. Mechler,Stephen Wu, Todd L. Cohen, Mark Lagus, Dieter Wendel,Bruno Spruth, Kevin Stanley, David Bogdan
International Symposium for Testing and Failure AnalysisISTFA 2013: Conference Proceedings from the 39th International Symposium for Testing and Failure Analysis (2013)
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Logic Yield Learning Vehicle Failure Analysis In Technology Development
Zhigang Song,Felix Beaudoin,Stephen Lucarini,Stephen Wu, Yunyu Wang, Lior Arie, Kobi Steiner
ISTFA 2012: CONFERENCE PROCEEDINGS FROM THE 38TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (2012)
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Challenges And Benefits Of Product-Like Sram In Technology Development
Felix Beaudoin,Stephen Lucarini,Fred Towler,Stephen Wu,Zhigang Song, David Albert,Laura Safran,John Sylvestri,Gauri Karve, Xiaojun Yu, Eli Kachir, Noam Jungmann
ISTFA 2011: CONFERENCE PROCEEDINGS FROM THE 37TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSISpp.362-366, (2011)
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