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Research Interests

Papers共 30 篇Author StatisticsCo-AuthorSimilar Experts

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Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics
P. M. Lenahan, E. B. Frantz,S. W. King,M. A. Anders,S. J. Moxim, K. J. Myers,M. E. Flatte,N. J. Harmon
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
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Relationship between Trapping Centers, Charge Pumping, and Leakage Currents in Hot-Carrier-Stressed Si/SiO2/HfO2 Transistors
S. J. Moxim,J. P. Ashton,M. A. Anders, N. W. Lawson,J. T. Ryan
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-4, (2023)
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Author Statistics

#Papers: 30

#Citation: 92

H-Index: 7

G-Index: 9

Sociability: 4

Diversity: 1

Activity: 3

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