Siew Lang Teo

Siew Lang Teo received the B.Tech. degree in electronics engineering from the National University of Singapore (NUS), Singapore, in 2007. Since 2000, she has been with the Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), Singapore, where she has over 15 years of experience in device fabrication, especially in III–V-based device processing. Her fabrication skillsets built over the years enabled her to have good understanding in fabrication process and also good knowledge in handling various processing tools. In 2013, she ventured her skillset in characterization of materials with focused ion beam (FIB)/transmission electron microscopy (TEM). Since then, she had participated in various projects related to materials characterization.