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个人简介
Shigetaka Tomiya was born in Tokyo, Japan, in 1963. He received the B.S. and M.S. degrees in physics and the Dr.Eng. degree in electronics engineering from Keio University, Tokyo, Japan, in 1986, 1988, and 1999, respectively.
In 1988, he joined Sony Corporation Research Center, Yokohama, Japan. He has been engaged microstructural analysis of AlGaAs, AlGaInP, ZnMgSSe, and AlGaInN materials systems. He was with the University of California, Santa Barbara, as a Visiting Researcher from 1991 to 1992, where he engaged in novel quantum structures. He is currently the Senior Manager and Senior Researcher with the Materials Analysis Department, Sony Corporation, Atsugi, Japan.
Dr. Tomiya is a member of the Japan Society of Applied Physics and the Japan Society of Microscopy.
研究兴趣
论文共 150 篇作者统计合作学者相似作者
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JOURNAL OF PHYSICAL CHEMISTRY LETTERSno. 14 (2024): 3772-3778
JAPANESE JOURNAL OF APPLIED PHYSICSno. 1 (2024)
Science and Technology of Advanced Materials: Methodsno. 1 (2024)
Tatsuya Kitazawa,Yuta Inaba,Shunsuke Yamashita,Shinya Imai, Keita Kurohara,Tetsuya Tatsumi,Hitoshi Wakabayashi,Shigetaka Tomiya
JAPANESE JOURNAL OF APPLIED PHYSICSno. 5 (2024)
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)pp.1-3, (2024)
Tatsuya Kitazawa,Yuta Inaba,Shunsuke Yamashita,Shinya Imai, Keita Kurohara,Tetsuya Tatsumi,Hitoshi WAKABAYASHI,Shigetaka Tomiya
Japanese Journal of Applied Physics (2024)
The Journal of Physical Chemistry Letterspp.3772-3778, (2024)
The journal of physical chemistry lettersno. 14 (2024): 3772-3778
Gallium Nitride Materials and Devices XIX (2024)
JAPANESE JOURNAL OF APPLIED PHYSICSno. 10 (2023)
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