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Papers共 94 篇Author StatisticsCo-AuthorSimilar Experts

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Monolithic Stacked FET with Stepped Channels for Future Logic Technologies
Chen Zhang, SeungMin Song,Jay Strane, Lijuan Zou, Seungchan Yun, Keumseok Park, Abir Shadman, Jaehong Lee, WuKang Kim, Utkarsh Bajpai, Larry Zhuang, Shahrukh Khan, Wai Kin Li,Shogo Mochizuki,Takashi Ando,Shay Reboh, Debarghya Sarkar, Myung Yang, Myunghoon Jung,Tsung-Sheng Kang, Ilhom Saidjafar, Nate Putnam,Shanti Pancharatnam,Muthumanickam Sankarapandian, Erik Milosevic, Junmo Park, Kishwar Mashooq, Prabudhya R. Chowdhury, Jim Mazza, Nick Lanzillo, Sarah N. Chowdhury, Yeojin Lee,Paul Jamison, Matt Malley, Pinlei Chu, Jeonghyun Hwang, Mohsen Nasseri, Kibyung Park, Namkyu Cho, Jongmin Shin, Inwon Park, Thanh Nguyen, Beomjin Park, Feng Liu, Shivani Kumar, Cliff Osborn,Juntao Li, Lukas Tierney,James Demarest, Junli Wang,Eric Miller, Susan Fan, Jingyun Zhang, Yu Zhu,John Arnold,Tenko Yamashita,Dan Dechene,Kang-Ill Seo,Dechao Guo,Huiming Bu
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
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Transferring Compressive or Tensile Stress from Stressors to Si Layers: A Novel Approach
Pablo Acosta Alba, Mayara Auricchio,Patrice Gergaud,Jean-Michel Hartmann,Shay Reboh
Extended Abstracts of the 2024 International Conference on Solid State Devices and Materials (2024)
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RF Figures of Merit of Polysilicon Trap-Rich Layers Formed Locally by Ion Amorphization and Nanosecond Laser Annealing
M. Perrose,P. Acosta Alba,M. Moulin,E. Augendre,J. Lugo,J. -P. Raskin,S. Reboh
2023 IEEE 23RD TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMSpp.25-27, (2023)
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EZ-FET Junctions Activation by Nanosecond Laser Annealing
N. Zerhouni Abdou,P. Acosta-Alba,L. Brunet,M. Opprecht,F. Milesi, M. Gallard,S. Reboh,I. Ionica
2023 21st International Workshop on Junction Technology (IWJT)pp.1-4, (2023)
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Author Statistics

#Papers: 94

#Citation: 912

H-Index: 20

G-Index: 24

Sociability: 6

Diversity: 3

Activity: 7

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