Ihle, Sebastian - max planck society

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论文共 39 篇作者统计合作学者相似作者

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Atomic-scale Quantification of Charge Densities in Two-Dimensional Materials

Knut Mueller-Caspary,Martial Duchamp,Malte Roesner,Vadim Migunov,Florian Winkler,Hao Yang,Martin Huth,Robert Ritz,Martin Simson,Sebastian Ihle,Heike Soltau,Tim Wehling,Rafal E. Dunin-Borkowski,Sandra Van Aert,Andreas Rosenauer

Physical review B/Physical review B（2018）

引用44浏览0引用

Direct Measurement of the Position Accuracy for Low Energy X-ray Photons with a Pnccd

S. Ihle,P. Holl,D. Kalok,R. Hartmann,H. Ryll, D. Steigenhoefer,L. Strueder

Journal of Instrumentation（2017）

引用18浏览0引用

Spatial Resolution Smaller Than the Pixel Size? Yes We Can

Lothar Strüder,Jeffrey M. Davis,Robert Hartman,Peter Holl,Sebastian Ihle, David Kalok,Heike Soltau

Microscopy and Microanalysis（2017）

引用3浏览0引用

Spatial Resolution Smaller Than the Pixel Size? Yes We Can

L. Strüder, Jeffrey M. Davis, R. Hartman,P. Holl,S. Ihle,D. Kalok,H. Soltau

Microscopy and Microanalysis (2017): 90-91

引用0浏览0引用

Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Martin Simson,Rafal E. Dunin-Borkowski,Robert Hartmann,Martin Huth,Sebastian Ihle,Lewys Jones,Yukihito Kondo,Vadim Migunov,Peter D. Nellist,Robert Ritz,Henning Ryll,Ryusuke Sagawa,Julia Schmidt,Heike Soltau,Lothar Strüder,Hao Yang

European Microscopy Congress 2016: Proceedingspp.51-52, (2016)

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Advances in Instrumentation, Detectors, FIB and Preparation IM1.002 The wave-particle duality of electrons demonstrated with sub-pixel resolution by recording off-axis electron holograms on a pnCCD direct detector

H. Ryll,M. Simson, C. Boothroyd,R. E. Dunin-Borkowski, C. Dwyer,R. Hartmann,M. Huth,S. Ihle, V., Migunov,K. Müller-Caspary,A. Rosenauer, J. Schmidt,H. Soltau,L. Strüder

semanticscholar（2016）

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High Speed, High Resolution Imaging Spectrometers Based on Pnccds for XRF and XRD Applications

L. Strüder,R. Hartmann,P. Holl,S. Ihle,M. Huth,J. Schmidt,Ch. Thamm, B. Kann-gieBer,J. Baumann, A. Renno,J. Grenzer,M. Radtke,A. Abboud,U. Pietsch,H. Soltau

Microscopy and Microanalysis（2016）

引用0浏览0引用

Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

M. Simson,R.E. Dunin-Borkowski,R. Hartmann,M. Huth,S. Ihle,L. Jones,Y. Kondo,V. Migunov,P.D. Nellist,R. Ritz,H. Ryll,R. Sagawa,J. Schmidt,H. Soltau,L. Strüder,H. Yang

Microscopy and Microanalysis（2016）

引用0浏览0引用

A Pnccd-Based, Fast Direct Single Electron Imaging Camera for Tem and Stem

H. Ryll,M. Simson,R. Hartmann,P. Holl,M. Huth,S. Ihle,Y. Kondo,P. Kotula,A. Liebel, K. Mueller-Caspary,A. Rosenauer,R. Sagawa,J. Schmidt,H. Soltau,L. Strueder

JOURNAL OF INSTRUMENTATION（2016）

引用107浏览0引用

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