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Research Interests

Papers共 240 篇Author StatisticsCo-AuthorSimilar Experts

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Modeling methodology for multi-die chip design based on gem5/SystemC co-simulation
Fabian Schätzle, Carlos Falquez, Stefan Heinen, Nam Ho,Antoni Portero,Estela Suarez, Johannes Van Den Boom,Stefan van Waasen
Workshop on Rapid Simulation and Performance Evaluationpp.35-41, (2024)
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Modeling methodology for multi-die chip design based on gem5/SystemC co-simulation
Fabian Schaetzle, Carlos Falquez, Stefan Heinen,Nam Ho,Antoni Portero,Estela Suarez, Johannes van den Boom,Stefan van Waasen
PROCEEDINGS OF THE RAPIDO 2024 WORKSHOP, HIPEAC 2024pp.35-41, (2024)
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NoC simulation steered by NEST: McAERsim and a Noxim patch
Markus Robens, Robert Kleijnen,Michael Schiek,Stefan van Waasen
Frontiers in neuroscience (2024): 1371103-1371103
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0
0
Modeling methodology for multi-die chip design based on gem5/SystemC co-simulation
Fabian Schätzle, Carlos Falquez, Stefan Heinen, Nam Ho, Antoni Portero, Estela Suarez, Johannes Van Den Boom,Stefan Van Waasen
RAPIDO '24: Proceedings of the 16th Workshop on Rapid Simulation and Performance Evaluation for Designpp.35-41, (2024)
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Simulation of Charge Stability Diagrams for Automated Tuning Solutions (SimCATS)
Fabian Hader, Sarah Fleitmann, Jan Vogelbruch,Lotte Geck,Stefan Van Waasen
crossref（2024）
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Modeling methodology for multi-die chip design based on gem5/SystemC co-simulation
Fabian Schätzle, Carlos Falquez, Stefan Heinen, Nam Ho,Antoni Portero,Estela Suarez, Johannes Van Den Boom,Stefan Van Waasen
Proceedings of the 16th Workshop on Rapid Simulation and Performance Evaluation for Design (2024)
Cited0Views0Bibtex
0
0
On Noise-Sensitive Automatic Tuning of Gate-Defined Sensor Dots
Fabian Hader, Jan Vogelbruch,Simon Humpohl,Tobias Hangleiter, Chimezie Eguzo,Stefan Heinen,Stefanie Meyer,Stefan van Waasen
IEEE Transactions on Quantum Engineering (2023): 1-18
Cited1Views0EIWOSBibtex
1
0
SiGe Qubit Biasing with a Cryogenic CMOS DAC at mK Temperature
Lea Schreckenberg,René Otten,Patrick Vliex,Ran Xue, Jhih-Sian Tu,Inga Seidler,Stefan Trellenkamp,Lars R. Schreiber, Hendrik Bluhm,Stefan van Waasen
ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC)pp.161-164, (2023)
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