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Papers共 40 篇Author StatisticsCo-AuthorSimilar Experts
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2020 IEEE 70th Electronic Components and Technology Conference (ECTC)pp.548-553, (2020)
International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)pp.1-3, (2018)
R. Mair,M. Kotelyanskii,M. Mehendale, X. Ru,P. Mukundhan,T. Kryman,M. Liebens,S. Van Huylenbroeck, L. Haensel, A. Miller,E. Beyne,T. Murray
2016 27TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC)pp.54.0-59.0, (2016)
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R. Mair,M. Kotelyanskii,M. Mehendale, X. Ru,P. Mukundhan,T. Kryman,M. Liebens,S. Van Huylenbroeck, L. Haensel,A. Miller,E. Beyne,T. Murray
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