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Papers共 68 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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期刊级别
合作者
合作机构
Fabia Farlin Athena,Omobayode Fagbohungbe,Nanbo Gong,Malte J. Rasch, Jimmy Penaloza,Sooncheon Seo,Arthur Gasasira,Paul Solomon,Valeria Bragaglia,Steven Consiglio,Hisashi Higuchi,Chanro Park,Kevin Brew,Paul Jamison,Christopher Catano,Iqbal Saraf, Claire Silvestre, Xuefeng Liu, Babar Khan, Nikhil Jain,Steven Mcdermott, Rick Johnson,I. Estrada-Raygoza,Juntao Li,Tayfun Gokmen,Ning Li,Ruturaj Pujari,Fabio Carta,Hiroyuki Miyazoe,Martin M. Frank,Antonio La Porta,Devi Koty,Qingyun Yang,Robert D. Clark,Kandabara Tapily,Cory Wajda,Aelan Mosden, Jeff Shearer,Andrew Metz,Sean Teehan,Nicole Saulnier,Bert Offrein, Takaaki Tsunomura,Gert Leusink,Vijay Narayanan,Takashi Ando
FRONTIERS IN ELECTRONICS (2024)
Zachary Gardner,Soon-cheon Seo, Pijeng Khor, Chris Waskiewicz,M. Sankarapandian,Eric Perfecto,James Demarest
2024 35TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, ASMC (2024)
N. Gong,M. J. Rasch,S. -C. Seo,A. Gasasira,P. Solomon,V. Bragaglia,S. Consiglio, H. Higuchi, C. Park,K. Brew,P. Jamison,C. Catano,I. Saraf,F. F. Athena,C. Silvestre, X. Liu, B. Khan,N. Jain,S. Mcdermott,R. Johnson,I. Estrada-Raygoza, J. Li,T. Gokmen,N. Li,R. Pujari,F. Carta,H. Miyazoe,M. M. Frank, D. Koty, Q. Yang,R. Clark,K. Tapily,C. Wajda,A. Mosden, J. Shearer, A. Metz,S. Teehan,N. Saulnier,B. J. Offrein,T. Tsunomura,G. Leusink,V. Narayanan,T. Ando
Y. Kim,S-C Seo,S. Consiglio,P. Jamison, H. Higuchi,M. Rasch,E. Y. Wu,D. Kong,I Saraf,C. Catano,R. Muralidhar,S. Nguyen, S. DeVries,O. Van der Straten,M. Sankarapandian,R. N. Pujari,A. Gasasira, S. M. Mcdermott,H. Miyazoe, D. Koty, Q. Yang, H. Yan,R. Clark,K. Tapily,S. Engelmann, R. R. Robison,C. Wajda,A. Mosden,T. Tsunomura, R. Soave,N. Saulnier,W. Haensch,G. Leusink, P. Biolsi,V Narayanan,T. Ando
Advanced Etch Technology for Nanopatterning IX (2020)
J. Li,Y. Kim,D. Kong,K. Cheng,S. -C. Seo, C. Robinson,N. Saulnier, R. R. Robison, A. J. Varghese,I. Ahsan,R. Muralidhar,T. Ando,V. Narayanan
International Symposium for Testing and Failure Analysis ISTFA 2020 Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
Metrology, Inspection, and Process Control for Microlithography XXXII (2018)
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Author Statistics
#Papers: 68
#Citation: 2775
H-Index: 26
G-Index: 52
Sociability: 7
Diversity: 2
Activity: 2
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