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个人简介
Sylvie Migot-Choux was born in 1968. She received the master's
degree in materials science in 1993. After, she worked during 21 years as the Technician with the University of
Lorraine. She prepared samples and characterized them by X-ray (Laue, Berg-Barret, and Lang), optical microscopy,
scanning electron microscopy (with EDS, EBSD), and transmission electron microscopy (with EDS). She is currently a
Engineer with the CNRS and she is responsible for two devices with the Institute Jean Lamour, Nancy, France: TEM
Philips CM200 and SEM-FIB Helios Nanolab 600i. She is the coauthor of 30 papers.
研究兴趣
论文共 122 篇作者统计合作学者相似作者
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PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION (2024)
MATERIALS HORIZONSno. 2 (2024): 460-467
D. Dubaux,M. -C de Weerd,J. Ghanbaja, S. Bruyere,A. Redjaimia,S. Migot,P. Boulet,S. Sturm, S. Semsari Parapari,V. Fournee,M. Sicot,J. Ledieu
MATERIALS TODAY COMMUNICATIONS (2024): 107877
Valentin Desbuis,Daniel Lacour,Coriolan Tiusan,Christopher Vautrin,S. Migot, J. Ghanbaja,Yuan Lu,Wolfgang Weber,Michel Hehn
PHYSICAL REVIEW Bno. 2 (2024)
Advanced materials (Deerfield Beach, Fla.)pp.e2401611-e2401611, (2024)
Applied Surface Sciencepp.160338, (2024)
INTERMETALLICS (2024): 108111-108111
SSRN Electronic Journal (2023): 172397-172397
Nature Communicationsno. 1 (2023): 2483-2483
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