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Bio
Stephen J. Moxim (Member, IEEE) received the bachelor’s degree in engineering science and mechanics from The Pennsylvania State University, where he is currently pursuing the Ph.D. degree in engineering science and mechanics. He has been working as a Research Assistant with the Semiconductor Spectroscopy Lab, Penn State since 2017. His research interests include the application of electrically detected magnetic resonance and near-zero-field magnetoresistance to semiconductor device reliability problems. He has authored/coauthored eight peer reviewed journal articles and submitted two more articles currently under review. He has contributed to 13 conference presentations.
Research Interests
Papers共 24 篇Author StatisticsCo-AuthorSimilar Experts
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JOURNAL OF APPLIED PHYSICSno. 15 (2024)
2023 IEEE International Integrated Reliability Workshop (IIRW) (2023)
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-4, (2023)
arXiv (Cornell University) (2023)
JOURNAL OF APPLIED PHYSICSno. 14 (2023)
IEEE Transactions on Nuclear Scienceno. 3 (2022): 1-1
Applied Physics Lettersno. 6 (2022)
Applied Physics Lettersno. 6 (2022): 063502-063502
The Review of scientific instrumentsno. 11 (2022): 115101-115101
2022 IEEE International Integrated Reliability Workshop (IIRW)pp.1-4, (2022)
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