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Papers共 17 篇Author StatisticsCo-AuthorSimilar Experts
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FRONTIERS IN ELECTRONICS (2024)
R. Bao, L. Qin,J. Frougier, S. Suk, M. Rabie, U. Bajpai, A. Chou, B. Nechay, M. Mohamed,R. Pujari, T. J Weir, K. Harmon,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
IEEE Transactions on Semiconductor Manufacturingno. 3 (2023): 327-331
Victor Chan,I. Ok,S. Choi,T. Gordon, N. Arnold,I. Saraf, S. McDermott,K. Brew,T. Philip,H. Utomo,W.-T. Tseng,C. Silvestre,
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2023)
Qianwen Chen,Michael Belyansky,Yasir Sulehria,Akihiro Horibe, Liqiao Qin,Ruturaj Pujari,Eric Perfecto,Fee Li Lie,Shahid Butt, Nick Polomoff,Risa Miyazawa,Sayuri Kohara,
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.1175-1180, (2023)
N. Gong,M. J. Rasch,S. -C. Seo,A. Gasasira,P. Solomon,V. Bragaglia,S. Consiglio, H. Higuchi, C. Park,K. Brew,P. Jamison,C. Catano,
2022 International Electron Devices Meeting (IEDM)pp.34.4.1-34.4.4, (2022)
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2022)
2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)pp.26.1.1-26.1.4, (2021)
J. Li,K. Brew, K. Cheng,V. Chan, N. Arnold,A. Gasasira,R. Pujari,J. Demarest, M. Iwatake, L. Tierney, O. Ogundipe, K. Toole,
International Symposium for Testing and Failure AnalysisISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
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