基本信息
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Bio
His research focuses on methods for the highly accurate measurement of optical surfaces with an emphasis on advanced deflectometric and multisensor techniques.
Research Interests
Papers共 64 篇Author StatisticsCo-AuthorSimilar Experts
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Ralf D Geckeler,Andreas Just,Michael Krause, Olaf Schnabel,Ian Lacey, Damon English,Valeriy V Yashchuk
Journal of synchrotron radiationno. Pt 4 (2024): 670-680
Bernd Grubert, David Kreitschik, Olaf Schnabel,Frank Siewert,Ralf. D. Geckeler,Matthias Schumann,Andreas Just,Michael Krause,Tanfer Yandayan, S. Asli Akgoz
ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII (2019)
Ian Lacey,Kevan Anderson,Gary P. Centers,Ralf D. Geckeler,Gevork Gevorkyan, John Grossiord,Andreas Just, Theo Nicolot,Brian V. Smith,Valeriy V. Yashchuk
Tanfer Yandayan,Ralf D. Geckeler,Andreas Just,Michael Krause, S Asli Akgoz, Murat Aksulu, Bernd Grubert,Tsukasa Watanabe
Ralf D. Geckeler,Andreas Just, Valentin Vasilev,Emilio Prieto, František Dvorácek, Slobodan Zelenika, Joanna Przybylska,Alexandru Duta, Ilya Victorov,Marco Pisani,Fernanda Saraiva, Jose-Antonio Salgado,
Christian F. Guertin,Ralf D. Geckeler
ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VII (2017)
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