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Papers共 100 篇Author StatisticsCo-AuthorSimilar Experts
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Victor Chan,A. Gasasira,R. Pujari,W.-T. Tseng, T. Gordon,R. Southwick,I. Ok,S. Choi, C. Silvestre,H. Utomo,K. Brew,T. Philip,
IEEE Transactions on Semiconductor Manufacturingno. 3 (2023): 327-331
2022 International Electron Devices Meeting (IEDM)pp.34.4.1-34.4.4, (2022)
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2022)
International Reliability Physics Symposium (2022)
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H. Wu, V. Katragadda, E. Evarts, E. Edwards,R. Southwick,A. Dutta,G. Lauer, V. Mehta, R. Johnson,O. van der Straten,A. Reznicek, M. Wordeman,
2021 IEEE International Electron Devices Meeting (IEDM)pp.2.3.1-2.3.4, (2021)
Recent Advances in PMOS Negative Bias Temperature Instabilitypp.199-220, (2021)
Recent Advances in PMOS Negative Bias Temperature Instabilitypp.251-266, (2021)
Recent Advances in PMOS Negative Bias Temperature Instabilitypp.221-249, (2021)
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