基本信息
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个人简介
Robert Gauthier, Jr. joined IBM, Essex Junction, VT, USA, in 1995, where he focused on device design and TCAD simulations designing devices in 0.35 µm technologies. In 1998, he expanded his role within IBM to also look at ESD and latchup devices in 0.25 µm and beyond. From 1998 to 2003, he worked on 0.25 µm - 0.13 µm technologies getting heavily involved in ESD and latchup. In 2004, he became an R&D Manager with IBM with emphasis on ESD/latchup development and RF modeling. From 2004 to 2015, he continued to manage the ESD/latchup team inside IBM along with various other functions, such as TCAD. In 2015, he and the majority of his team joined GlobalFoundries during an acquisition where from 2015 to 2020, he has led the worldwide ESD/latchup team within GlobalFoundries, including folks in the USA, Dresden, and Singapore. He has over 285 issued patents with many others filed, he has >40 publications at major conferences and journals. He has served on the ESDA BoD in the past and is currently on the ESDA BoD, he is also currently an Active Member on the ESDA EXCOM Team. He was one of the Founders of the International ESD Workshop and is the Former General Chair of the EOS/ESD Symposium.
研究兴趣
论文共 245 篇作者统计合作学者相似作者
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.1-6, (2022)
2022 44th Annual EOS/ESD Symposium (EOS/ESD) (2022): 1-8
2020 International EOS/ESD Symposium on Design and System (IEDS) (2021)
2021 43RD ANNUAL EOS/ESD SYMPOSIUM (EOS/ESD) (2021)
2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (2021): 1-7
2020 International EOS/ESD Symposium on Design and System (IEDS)pp.1-5, (2021)
2020 International EOS/ESD Symposium on Design and System (IEDS)pp.1-5, (2021)
2021 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) (2021)
2020 International EOS/ESD Symposium on Design and System (IEDS)pp.1-4, (2021)
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作者统计
#Papers: 245
#Citation: 5661
H-Index: 32
G-Index: 44
Sociability: 6
Diversity: 1
Activity: 0
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