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个人简介
Prof. van Aken’s research focuses on the atomic-scale characterization of interfaces, functional complex oxide hetero-structures, strained semiconductors, of optical properties of nanostructured thin films and plasmonic-active nanostructures, nanoparticles and nanomaterials, as well as of molecules on 2D materials. He uses and further develops the advanced scanning TEM techniques electron energy-loss spectroscopy, energy-dispersive X-ray spectroscopy, in-line electron holography, in-situ TEM methods, strain mapping, quantitative high-resolution TEM analysis, different quantitative electron diffraction techniques, image processing and simulation, and 4D-STEM, electron ptychography and tomography.
研究兴趣
论文共 649 篇作者统计合作学者相似作者
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S. Hayashida, V. Sundaramurthy,P. Puphal,M. Garcia-Fernandez,Ke-Jin Zhou, B. Fenk, M. Isobe,M. Minola, Y. -M. Wu,Y. E. Suyolcu,P. A. van Aken,B. Keimer,
Physical Review Bno. 23 (2024)
Advanced materials (Deerfield Beach, Fla.)no. 23 (2024): e2310817-e2310817
ACS nanono. 17 (2024): 11270-11283
ADVANCED FUNCTIONAL MATERIALSno. 4 (2024)
Nature Communicationsno. 1 (2024): 378-378
Prosper Ngabonziza, Anand Sharma, Anna Scheid, Sethulakshmi Sajeev,Peter A. van Aken,Jochen Mannhart
PHYSICAL REVIEW MATERIALSno. 4 (2024)
ADVANCED MATERIALSpp.e2405065-e2405065, (2024)
Hongguang Wang, Jiawei Zhang,Chen Shen, Chao Yang,Kathrin Kuester,Julia Deuschle,Ulrich Starke,Hongbin Zhang,Masahiko Isobe,Dennis Huang,Peter A. van Aken,Hidenori Takagi
NATURE COMMUNICATIONSno. 1 (2024): 2541-2541
Nicolas Bonmassar,Georg Christiani, Maximilian Brucker,Gennady Logvenov,Y. Eren Suyolcu,Peter A. van Aken
ADVANCED FUNCTIONAL MATERIALS (2024)
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