基本信息
views: 0
![](https://originalfileserver.aminer.cn/sys/aminer/icon/show-trajectory.png)
Bio
No content for now
Research Interests
Papers共 10 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Nagesh Basavanhally,Daniel Lopez,Vladimir Aksyuk,Dave Ramsey, Eric Bower,Ray Cirelli,E. Ferry,Robert Frahm, John Gates, Fred Klemens,Warren Lai,Yee Low,
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XVII, PTS 1 AND 2 (2000): 171-180
Proceedings of SPIE, the International Society for Optical Engineering (1999): 320-328
Raymond A. Cirelli,J. Bude,William M. Mansfield, G. L. Timp, Fred P. Klemens,Pat G. Watson, Gary R. Weber,James R. Sweeney,Francis M. Houlihan,Allen H. Gabor, Fred Baumann, M. Buonanno,
SPIE Proceedings Advances in Resist Technology and Processing XVI (1999)
23rd Annual International Symposium on Microlithography (1998): 131-139
18TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY AND MANAGEMENT (1998): 540-547
Pat G Watson,Joseph G Garofalo, M Hansen,Ilya Grodnensky,Ludwik J Zych, Richard Takahashi, Willie J Yarbrough, Edward Ehrlacher, A Reim,R Vella,Alan D F Dunbar, Albert Colina,
OPTICAL MICROLITHOGRAPHY X (1997): 374-383
EMERGING LITHOGRAPHIC TECHNOLOGIES (1997): 255-263
Joseph G Garofalo,Pat G Watson, L E Trimble,R Cirelli, Albert Colina,Ilya Grodnensky, B Herrero,Alan D F Dunbar, Frederick R Peiffer, Ryo Takahashi,Regine G Tarasconauriol, Willie J Yarbrough,
Steven D. Berger, Christopher J. Biddick,Myrtle I. Blakey,Kevin J. Bolan,Stephen W. Bowler,Kevin J. Brady, Ron M. Camarda,Wayne F. Connelly,Reginald C. Farrow,Joseph A. Felker,Linus A. Fetter,Lloyd R. Harriott,
Author Statistics
#Papers: 10
#Citation: 61
H-Index: 4
G-Index: 7
Sociability: 5
Diversity: 0
Activity: 0
Co-Author
Co-Institution
D-Core
- 合作者
- 学生
- 导师
Data Disclaimer
The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn