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Papers共 165 篇Author StatisticsCo-AuthorSimilar Experts
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METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIIno. 3 (2023)
Maya Wehbe,Matthew Charles,Kilian Baril,Blandine Alloing, Daniel Pino Munoz, Nabil Labchir,Jesus Zuniga-Perez,Carsten Detlefs,Can Yildirim,Patrice Gergaud
Journal of applied crystallographyno. Pt 3 (2023): 643-649
Andrea Quintero, Pablo Acosta Alba, Jean-Michel Hartmann,David Cooper,Patrice Gergaud,Vincent Reboud,Philippe Rodriguez
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY (2023): 687-694
Microelectronic Engineering (2023): 111919-111919
Andrea Quintero, Pablo Acosta Alba, Jean-Michel Hartmann,Patrice Gergaud,Vincent Reboud,Philippe Rodriguez
2023 21st International Workshop on Junction Technology (IWJT)pp.1-4, (2023)
Timothee Choisnet, Abdelali Hammouti, Vincent Gagneur,Jerome Reche,Guido Rademaker,Guillaume Freychet, Guillaume Jullien, Julien Ducote,Patrice Gergaud,Delphine Le Cunff
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
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