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个人简介
Nick is a Fellow of the IEEE (Institute of Electrical and Electronics Engineers), a Fellow of the IET (Institution of Engineering and Technology), and a Fellow of the IOP (Institute of Physics). He is a Visiting Professor at the University of Leeds (in the School of Electronic and Electrical Engineering); a Visiting Professor at the University of Surrey (in the Faculty of Engineering and Physical Sciences); and a Visiting Professor at the University of Liverpool (in the Department of Electrical Engineering and Electronics). He also holds a Fellowship in Nonlinear Measurements at the Advanced Technology Institute, University of Surrey.
Nick is an internationally-renowned expert in precision high-frequency electromagnetic measurements (from RF to terahertz frequencies), authoring or co-authoring over 200 publications in this field, and has over 30 years' experience working in industrial, government and academic research establishments. He has twice been the recipient of the IEE Measurement Prize (in 1995 and 2005) and holds nine Best Paper awards from international scientific conferences. He takes lead roles in several international activities in this area, including:
Chair - IEEE MTT-S AdCom Standards Coordinating Committee (SCC), 2014-present
Past President - ARFTG (IEEE Automatic RF Techniques Group) Board of Directors, President 2011-2013
Emeritus Chair - IEEE MTT-S 'Microwave Measurements' Technical Committee (MTT-11); Chair 2010-2012
Emeritus Chair - IET 'RF & Microwave Technology' Technical & Professional Network; Chair, 2009-2012
Chair and Founder - IEEE-Standards Association: P1785 Standard Working Group, 'Waveguides for Millimeter and Submillimeter Wavelengths', 2008-present
Vice-Chair and Co-founder - IEEE-Standards Association: P287 Standard Working Group, 'Precision Coaxial Connectors for RF, Microwave and Millimeter-wave Frequencies', 2010-present
Nick also represents the IEC (International Electrotechnical Commission) on the BIPM's Joint Committee for Guides in Metrology (JCGM) 'Working Group on the Expression of Uncertainty in Measurement (GUM)'.
研究兴趣
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESno. 4 (2024): 2193-2201
Manoj Stanley,Martin Salter,Jonas Urbonas, James Skinner,Sang-Hee Shin, Sebastian E. de Graaf,Nick M. Ridler
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENTno. 99 (2024): 1-6
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT (2024): 1-8
Manoj Stanley,Xiaobang Shang,Murat Celep,Martin Salter,Sebastian de Graaf,Tobias Lindstrom,Sang-Hee Shin, James Skinner, Dilbagh Singh,Daniel Stokes, Manognya Acharya,Nick Ridler
IEEE Access (2023): 79073-79086
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERSno. 2 (2023): 236-236
2023 53RD EUROPEAN MICROWAVE CONFERENCE, EUMCpp.584-587, (2023)
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