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个人简介
Ngoc Thanh Mai Tran was born in Ho Chi Minh city, Vietnam, in 1992. She received the B.Sc. and M.Sc. degrees in electronic engineering from the Politecnico di Torino, Turin, Italy, in 2014 and 2017, respectively. She did master’s thesis at the National Metrology Institute of Japan (NMIJ), Tsukuba, Japan. She is currently pursuing the Ph.D. degree in metrology with the Politecnico di Torino and the Istituto Nazionale di Ricerca Metrologica, Turin.
She is involved in several projects related to the metrology of electrical impedance at the Politecnico di Torino and the Istituto Nazionale di Ricerca Metrologica. She is currently a Guest Researcher with the Korea Research Institute of Standards and Science (KRISS), Daejeon, South Korea.
研究兴趣
论文共 27 篇作者统计合作学者相似作者
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Dean G. Jarrett,Albert F. Rigosi, Dominick S. Scaletta,Ngoc Thanh Mai Tran,Heather M. Hill,Alireza R. Panna, Cheng Hsueh Yang,Yanfei Yang,Randolph E. Elmquist,David B. Newell
arxiv(2024)
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AIP ADVANCESno. 5 (2023)
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arXiv (Cornell University) (2023)
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arXiv (Cornell University) (2023)
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MEASUREMENT SCIENCE AND TECHNOLOGYno. 7 (2023): 075009-075009
IEEE Transactions on Instrumentation and Measurement (2023): 1-10
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Physical review. Bno. 12 (2023)
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