Muhammad Salman Habib

I am a materials scientist with 5 years of graduate research in fundamental materials characterization, with an emphasis on X-ray diffraction characterization, design, of semiconductor device measurements of optoelectronic materials (thin films and nanoparticles). Adept at correlating optical measurements to structural and electronic properties. I have an excellent scientific publication record and my work was the basis for most of the two-dimensional perovskite work in my research group.