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个人简介
Morteza Safai is a technical fellow at the Boeing Company. His area of expertise includes; nondestructive inspection sensors and systems with emphasis in nanotechnology, x-ray backscattering and CT, MEMS, IR Imaging, Shearography, machine vision and microwave testing. His work experience includes: 23 years at The Boeing Company where for the last 12 years been working on X-ray backscattering system, 4 years at FMC Technology Inc. where he developed automated x-ray food inspection system, and 2 years at QI2 where he developed optical inspection systems. He has over 200 Invention disclosures, over 100 issued US patents, and 20 technical publications. He, holds a BS and MS. Physics from University of Utah. He is currently the session chair for SPIE and IEEE.
研究兴趣
论文共 40 篇作者统计合作学者相似作者
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mag(2015)
引用21浏览0引用
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Sahrudine Apdalhaliem,Kimberly D Meredith,Morteza Safai, Lon E Switzer, Thomas Seth Perkins, Scott A Langdon,Tuan D Nguyen
mag(2015)
引用23浏览0引用
23
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mag(2015)
引用23浏览0引用
23
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Matthew T Grimshaw,Talion Edwards,Gary E Georgeson,Daniel J Wright,James E Engel,Morteza Safai, Yuanjye Wu,Taisia Tsukruk Lou, Rodney S Wright
mag(2015)
引用23浏览0引用
23
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